Nasdaq

Advantest Unveils T5801 Ultra-High-Speed Memory Test System to Power Next-Generation DRAM Devices

TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the T5801 Ultra-High-Speed DRAM Test System. The cutting-edge ...
Business Wire

Teradyne Unveils Magnum 7H - The Next-Generation Memory Tester for High Bandwidth Memory Devices

NORTH READING, Mass.--(BUSINESS WIRE)--Teradyne, Inc. (NASDAQ: TER), a leading provider of automated test equipment and advanced robotics, is proud to announce the launch of the Magnum 7H, a ...
Semiconductor Engineering

AI Memory: Enabling The Next Era Of High-Performance Computing

The rapid advancement of artificial intelligence (AI) is driving unprecedented demand for high-performance memory solutions. AI-driven applications are fueling significant year-over-year growth in ...
Business Wire

Keysight Introduces Comprehensive LPDDR6 Solution for End-to-End Memory Design and Test Workflows

Delivers complete design and validation solution for Low-Power Double Data Rate 6 (LPDDR6) memory in mobile, client computing, and AI applications. Supports JEDEC’s ongoing development of the new ...
Semiconductor Engineering

Optimizing Tester Memory Resources With Pooling Technology

The rapid evolution of semiconductor devices has amplified the demand for advanced automated test equipment (ATE) that can handle increasingly complex test scenarios for logic devices. ATE vector ...